Reflectance Measuring System MSP-100

Achieves high-speed, high-precision measurement of micro-areas, curved surfaces,
and ultra-thin samples at unprecedented low cost.

By using a special half-mirror (patented), backside reflection is eliminated, allowing for quick and accurate measurement without backside treatment.(Capable of measuring the reflectance of thin plates down to 0.2 mm using a 20 x objective lens)
Measurements of lens curvature and coating unevenness are also possible. (Focuses a micro-spot of φ50 um on the sample surface)
Highly reproducible measurements can be performed on low-reflection samples in a short time. (Our unique optical design maximizes light intake, and with a 512-element linear PDA,16-bit A/D converter, and USB 2.0 interface, enables high-speed computation for fast measurement)
Chromaticity and L*a*b* measurements are available. Object measurements are based on spectro-colorimetry using spectral reflectance.
Data can be saved in Microsoft Excel® format.
Single-layer films can be measured non-contact and non-destructively.
Multiple measurement results can be displayed on the same screen, making result comparison easy.

Model Number	MSP-100
Measuring Range of Wavelength	380 ~ 1050 nm
Accuracy of Measurement Repeatability	±0.2 % (380 ~ 450 nm) ±0.02 % (451 ~ 950 nm) ±0.2 % (951 ~ 1050 nm)
N.A. of Specimen	N.A. 0.12 (when use 10 x Objective lens)
Measuring Range of Wavelength	ø50 um (when use 10 x Objective lens)
Radius of Curvature of Specimen	-1 R ~ -∞, +1 R ~ ∞
Resolution Display	1 nm
Measuring Time	Within 10 sec (depends on the sampling time)
External dimensions(Main body)	(W) 230 x (H) 560 x (D) 460 mm (Main body)
Operating temperature limit	18 ~ 28 ˚C
Humidity used	60 % or less (with no condensation)
List Price	4,000,000 yen