Reflectance Measuring System MSP-100
By using a special half-mirror, a high-precision spectral measuring result may be obtained without worrying about the trouble of back side reflection.And of course, at an excellent cost-performance !
- By using a special half-mirror (Patent being processed), this device may cut the reflected light of back side, and offer you a high accuracy measuring result.
- It may measure curved surface of any lens, as well as an uneven coating. (Minimum spot focused on the specimen is ø50 µm)
- By using built-in 512 - element PDA, 16 bit AD converter, USB 2.0 interface.
- Chromaticity diagram, L*a*b are measurable.
- Non-contact measuring and non-destructive measuring are available for single layer coating.
Specification
Cat. No. |
MSP-100 |
Measuring Range of Wavelength |
380 ~ 1050 nm |
Accuracy of Measurement Repeatability |
±0.2 % (380 ~ 450 nm) ±0.02 % (451 ~ 950 nm) ±0.2 % (951 ~ 1050 nm) |
N.A. of Specimen |
N.A. 0.12 (when use 10x Objective lens) |
Measuring Range of Wavelength |
ø50 µm (when use 10x Objective lens) |
Radius of Curvature of Specimen |
-1 R ~ -∞, +1 R ~ ∞ |
Resolution Display |
1 nm |
Measuring Time |
Within 10 sec (depends on the sampling time) |
External dimensions(Main body) |
(W) 230 x (H) 560 x (D) 460 mm (Main body) |
Operating temperature limit |
18 ~ 28 ˚C |
Humidity used |
60 % or less (with no condensation) |
Price |
\ 4,000,000.- |
Measurement result image